期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2015
期号：MULTICON
页码：388
出版社：S&S Publications
摘要：The counterfeiting and recycling of integrated circuits (ICs) have become major issues in recent years,potentially impacting the security and reliability of electronic systems bound for military, financial, or other criticalapplications. With identical functionality and packaging, it would be extremely difficult to distinguish recycled ICsfrom unused ICs. In the existing Ring Oscillator (RO) based sensor with 90nm technology test chip shows the effectivedetection of recycled ICs. The impact of RO based sensor is that, it is difficult to identify recycled ICs used shorter thanone month and it requires more power and area overhead. To provide a solution to the existing system, Clock Antifuses (CAF) based sensor is implemented to enhance the effective recognition of recycled ICs even if the IC used for avery short period. MAF is implemented in FPGA to verify its effectiveness.
