期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2015
期号：MULTICON
页码：588
出版社：S&S Publications
摘要：Transient multichip upset (MCU) Problems becoming more prominent effects with large impact onmemory reliability. It is necessary to protect memory cells using protection codes, for this purpose several errorcorrection codes (ECCs) are used, but the main problem is that they require complex architecture(encoder and decode).Decimal matrix code (DMC) is used to minimize the area and delay overhead. Hamming codes have been proposed formemory protection. The main issue is that error correction capability not improved in all cases and also required largeredundant .In proposed code based on divide-symbol method with encoder reuse technique (ERT) used for minimizearea overhead extra circuits needed and reduce redundant bit.
