期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2016
卷号：5
期号：5
页码：9042
DOI：10.15680/IJIRSET.2016.0505346
出版社：S&S Publications
摘要：The high performance VLSI designs are achieved via different technique where scaling is the primaryapproach used in last few decades. The process variation which is the outcome of limitation of fabrication technology,causing a significant yield failure. Process variations is deviation in devices parameter from their original value andbecoming so severe that further scaling is not possible. The designs which are implemented without consideringprocess variations fails to provide correct output. The modern devices not only demand high performance, energyefficient operation but also demand operation should be done accurately. Therefore, critical analysis is required, andcorresponding mitigation technique has to be introduced to perform signal processing accurately. This paper firstcritically analyses different types of process variations and then evaluates the effectiveness of the body bias approach tomitigate the effect of process variation. The simulation results show the body bias approach significantly reduces theprocess variation severity.
关键词：Very Large Scale Integration; Fabrication; Process Variations; Technology scaling.
