期刊名称：International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN：2347-6710
电子版ISSN：2319-8753
出版年度：2013
卷号：2
期号：2
页码：442
出版社：S&S Publications
摘要：This paper examines the effect of new technology trends such as less power consumption and smaller chipfeature size on very large scale integration devices. The conventional way of detecting soft error is to save one parity bitwith each message word and by checking the parity bit at the output we can detect the soft error. But in proposedmethod, an approach is provided which can be applied on previously saved data and afterwards error can be detected. Inthis method 64 bit data is saved in a VLSI chip and then 8 bit parity sequence of this data is generated. After sometimesdue to some transient changes like alpha particles from package decay, cosmic rays emission and thermal neutrons,error may be generated in that saved data of 64 bit. The proposed method can be used to detect a single bit soft errorfrom the saved data by using the parity detection method.
关键词：Neutron; cosmic rays; parity bit and soft error
