摘要：Thin films of Bismuth Telluride (Bi2Te3) are prepared by thermal evaporation from nanopowders on the glass substrates. The XRD patterns of films show that all the films are polycrystalline and the crystalline increased by annealing temperature. Measuring of the thermoelectric power of thin films in the temperature range 300 to 380 K shows that Seebeck Coefficients have both negative and positive values, indicating that the films have both n-type and p-type conductivity. The re-crystallization of films is done by annealing from 130°C to 175°C and Seebeck Coefficient varied from -150 to 100 μV/K.
