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  • 标题:Gate fidelity and coherence of an electron spin in an Si/SiGe quantum dot with micromagnet
  • 本地全文:下载
  • 作者:Erika Kawakami ; Thibaut Jullien ; Pasquale Scarlino
  • 期刊名称:Proceedings of the National Academy of Sciences
  • 印刷版ISSN:0027-8424
  • 电子版ISSN:1091-6490
  • 出版年度:2016
  • 卷号:113
  • 期号:42
  • 页码:11738-11743
  • DOI:10.1073/pnas.1603251113
  • 语种:English
  • 出版社:The National Academy of Sciences of the United States of America
  • 摘要:The gate fidelity and the coherence time of a quantum bit (qubit) are important benchmarks for quantum computation. We construct a qubit using a single electron spin in an Si/SiGe quantum dot and control it electrically via an artificial spin-orbit field from a micromagnet. We measure an average single-qubit gate fidelity of ∼99% using randomized benchmarking, which is consistent with dephasing from the slowly evolving nuclear spins in the substrate. The coherence time measured using dynamical decoupling extends up to ∼400 μs for 128 decoupling pulses, with no sign of saturation. We find evidence that the coherence time is limited by noise in the 10-kHz to 1-MHz range, possibly because charge noise affects the spin via the micromagnet gradient. This work shows that an electron spin in an Si/SiGe quantum dot is a good candidate for quantum information processing as well as for a quantum memory, even without isotopic purification.
  • 关键词:Si/SiGe quantum dot ; qubit ; dynamical decoupling ; randomized benchmarking ; electron spin
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