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文章基本信息

  • 标题:Designing of Bayesian Skip Lot Sampling Plan under Destructive Testing
  • 本地全文:下载
  • 作者:Suresh, K. K. ; Umamaheswari, S.
  • 期刊名称:Journal of Modern Applied Statistical Methods
  • 出版年度:2016
  • 卷号:15
  • 期号:2
  • 页码:41
  • 出版社:Wayne State University
  • 摘要:Skip-lot sampling plan serves as a cost-effective technique to manage the cost of performing frequent product inspections. As a powerful tool within a real-time quality management system, the ability to collect data which an optimize skip-lot sampling parameters affords manufacturers the luxury of lowering inspection expenses in various manufacturing units. The good quality of product can be produced in continuous improvement of production process in excellent quality history for suppliers. The procedures and necessary tables are provided for finding the respective plans for which sum of producer and consumer risks are minimized with acceptable and limiting quality levels which accounts for the prior distribution of process state for each lot and revenue received appreciably which reduces destructive testing.
  • 关键词:Bayesian sampling plan; gamma-Poisson distribution; producer’s quality level; consumer’s quality level; weighted risk
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