期刊名称：International Journal of Signal Processing, Image Processing and Pattern Recognition
印刷版ISSN：2005-4254
出版年度：2016
卷号：9
期号：10
页码：97-108
出版社：SERSC
摘要：As the advancement in technology the number of application per chip is increasing and chip area remain same. If number of application per chip is increasing so the difficulty level of analog circuit becomesmore and more complex. So there are various fault occur in analog VLSI circuits during manufacturing of any analog circuit. If these faultscannot diagnose and remove at initial stage then it will lead to various changes in output of system, which increase the overall cost. In this article we focused on modeling, analysis and diagnosis of various faultswhich occur in analog VLSI circuit. We describe new approach to diagnose parametric and catastrophic fault in analog circuitswith the help of signal flow graph technique. This technique is very simple and structural in nature. It is applicable to various linear analog VLSI circuits. In this paper we implement this approach on MIMO (Multi Input Multi Output Circuit).All the equation and model for MIMOcircuit and simulation are done with the help of MATLAB/Simulinktool.
关键词：Parametric; Faults; Modeling; MIMO; ;Diagnosis; Signal Flow Graph
