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文章基本信息

  • 标题:Analysis of 4p-Kappa TEF in to Software Reliability Growth Model and Optimal Software Release Policy
  • 作者:Sk.Md.Rafi ; K.Nageswara Rao ; K.Pallam Sety
  • 期刊名称:International Journal of Computer Science and Network Security
  • 印刷版ISSN:1738-7906
  • 出版年度:2010
  • 卷号:10
  • 期号:2
  • 页码:119-130
  • 出版社:International Journal of Computer Science and Network Security
  • 摘要:This paper investigates a SRGM (Software reliability growth model) based on NHPP (non-homogeneous Poisson process) which incorporates the 4p-Kappa testing effort function. Testing Software reliability is generally a key factor in software quality. Reliability is an essential ingredient in customer satisfaction. In software development process reliability conveys the information to managers to access the amount of testing effort and time at which software release into the market. Many papers are published in this context. Performance application of proposed model is demonstrated through real datasets. The experimental results shown that the model gives an excellent performance compared to other models. We also discuss the optimal release time based on reliability requirement and cost criteria.
  • 关键词:Non-homogeneous Poisson process; Mean value function; Optimal software release time; Software reliability growth model; Testing-effort function
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