期刊名称：Journal of Theoretical and Applied Information Technology
印刷版ISSN：1992-8645
电子版ISSN：1817-3195
出版年度：2011
卷号：34
期号：1
页码：096-099
出版社：Journal of Theoretical and Applied
摘要：Deciding test data volume is a major challenge in present System on Chip (SoC) design. Compaction of test data volume results in high compression ratio. Entropy analysis plays a vital role in such cases. Entropy is measurement of the amount of information contained in the data set. Entropy calculations tell the need of how much test data vector that can be compressed. This paper is based on finding entropy calculations to achieve maximum test data compression. Further, entropy study for unspecified bits (don�t care bits) and complement method are also explored which result in high compression ratio. Entropy analysis for different symbol length partitioning is done. For the fixed-length symbol, one fill and zero fill algorithm is applied for unspecified bits, reducing the entropy. The proposed method is successfully tested on ISCAS89 which achieves maximum compression ratio
关键词：Entropy Analysis; Unspecified Bit; One And Zero Fill Techniques; Test Data Compression
