Increase in design complexity and fabrication technology results in high test data volume. As test size increases memory capacity also increases, which becomes the major difficulty in testing System-on-Chip (SoC). To reduce the test data volume, several compression techniques have been proposed. Code based schemes is one among those compression techniques. Run length coding is one of the most popular coding methodology in code based compression. Run length codes like Golomb code, Frequency directed run Length Code (FDR code), Extended FDR, Modified FDR, Shifted Alternate FDR and OLEL coding compress the test data and the compression ratio increases drastically. For further reduction of test data, double compression technique is proposed using Huffman code. Compression ratio using Double compression technique is presented and compared with the compression ratio obtained by other Run length codes.