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  • 标题:NOVEL HIGH RELIABILITY BANDGAP-BASED UNDER-VOLTAGE-LOCKOUT METHODS
  • 本地全文:下载
  • 作者:HUI WANG ; YONG-RUI ZHAO ; SONG-LIN WANG
  • 期刊名称:Journal of Theoretical and Applied Information Technology
  • 印刷版ISSN:1992-8645
  • 电子版ISSN:1817-3195
  • 出版年度:2013
  • 卷号:48
  • 期号:1
  • 页码:081-086
  • 出版社:Journal of Theoretical and Applied
  • 摘要:In this paper, a novel method to build under-voltage-lockout (UVLO) circuit has been developed. The method based on band gap reference voltage comparator, which take advantage of a reference voltage produced by itself realizes voltage compare, stability of parameters such as threshold point voltage, hysteretic range, without utilizing an extra band gap reference voltage. An abstractive feature of the proposed circuit is that it achieves UVLO function by a simple structure, without complicated logic components. Therefore, its power consumption is low. With the presented method, the novel under voltage lock out circuit achieves hysteretic range of 2.39V; its turn-on voltage is 12.0V, and turn-off voltage is 9.61V at 25.39V. Simulation results are based on 0.5 μm BCD process technologies.
  • 关键词:Power Management; Under Voltage Lock Out; Bandgap Voltage Reference; Hysteretic Range.; 
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