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  • 标题:ANALYSIS AND EXPERIMENT OF DYNAMIC CHARACTERISTICS OF ELECTRONIC DEVICE CHASSIS
  • 本地全文:下载
  • 作者:HE QING ; DU DONGMEI ; JIANG XUCHAO
  • 期刊名称:Journal of Theoretical and Applied Information Technology
  • 印刷版ISSN:1992-8645
  • 电子版ISSN:1817-3195
  • 出版年度:2013
  • 卷号:48
  • 期号:1
  • 页码:589-594
  • 出版社:Journal of Theoretical and Applied
  • 摘要:During design process of electronic device chassis, dynamic analysis plays a very important role in improving its environment adaptability. After analyzing characteristic of chassis, a finite element model is established and employed. The analysis model and its harmonic responses based on the ANSYS are presented. The reasonable of the finite element model is verified by the experiment results of sweep frequency excitation vibration to typical electronic device chassis used in nuclear power station. Vibration modal analysis shows the weakest location of the chassis.
  • 关键词:Electronic Device Chassis; Finite Element Model; Vibration Characteristics; Sweep Frequency Experiment
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