期刊名称：Journal of Theoretical and Applied Information Technology
印刷版ISSN：1992-8645
电子版ISSN：1817-3195
出版年度：2013
卷号：55
期号：2
出版社：Journal of Theoretical and Applied
摘要：The aim of built in self-test is to make the machine to test by itself. The best method among the built in self-test is pseudo exhaustive two pattern generation produces the output according to the input given with 16bit generator. The main drawback that occurs in this test pattern generation is maximum delay. It occurs in the carry generator module. In this paper, the method proposed with recursive pseudo exhaustive two pattern generator to reduce the delay is that mixing the block of carry generator and adder in order to minimize the delay that produced while in testing process. A method of approaching the testing problem at the chip level is to appropriate built-in self-test capacity that present inside a chip. In exhaustive testing number of test vector are more which is decreased in pseudo exhaustive testing. Built in self-Test pattern generators are commonly discerned into one-pattern and two-pattern generators.
关键词：Built In Self-Test; Two Test Pattern Generator; Carry Generator; Recursive; And Pseudo-Exhaustive Generator
