出版社：The Institute of Image Information and Television Engineers
摘要：A method of measuring the scattering patterns of materials having low reflectivity is proposed. The principle of this method is based on planar near field measurement in antenna technology. The scattering field of a material is distinguished from the mixed field composed of the main incidence, scattering field, and multi-path reflected fields by using a two-element endfire array. Furthermore the modified synthetic aperture radar method is also introduced in order to develop the surface current distribution on the material. The paper describes the measuring principle, error estimation by using simulation data, and experimental results for two samples. Taking into account pseudo-random noise the simulation results suggest that the method proposed here can measure the scattering pattern of materials having reflectivity of-20 dB when the noise level is about-40 dB.
