期刊名称：Proceedings of the National Academy of Sciences
印刷版ISSN：0027-8424
电子版ISSN：1091-6490
出版年度：2009
卷号：106
期号：14
页码：5457-5463
DOI：10.1073/pnas.0900700106
语种：English
出版社：The National Academy of Sciences of the United States of America
摘要：We provide a representation for the scaling limit of the d = 2 critical Ising magnetization field as a (conformal) random field by using Schramm-Loewner Evolution clusters and associated renormalized area measures. The renormalized areas are from the scaling limit of the critical Fortuin-Kasteleyn clusters and the random field is a convergent sum of the area measures with random signs. Extensions to off-critical scaling limits, to d = 3, and to Potts models are also considered.
关键词：continuum scaling limit ; critical Ising model ; FK clusters ; SLE ; CLE
