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  • 标题:Variable deletion and duplication at recombination junction ends: Implication for staggered double-strand cleavage in class-switch recombination
  • 本地全文:下载
  • 作者:Xiaochuan Chen ; Kazuo Kinoshita ; Tasuku Honjo
  • 期刊名称:Proceedings of the National Academy of Sciences
  • 印刷版ISSN:0027-8424
  • 电子版ISSN:1091-6490
  • 出版年度:2001
  • 卷号:98
  • 期号:24
  • 页码:13860-13865
  • DOI:10.1073/pnas.241524898
  • 语种:English
  • 出版社:The National Academy of Sciences of the United States of America
  • 摘要:Immunoglobulin class-switch recombination (CSR) gives rise to looped-out circular DNA of a cleaved S segment, which is lost eventually after cell divisions. To understand the molecular mechanism of S region cleavage during CSR, we constructed artificial CSR substrates in which inversion-type CSR takes place to retain the cleaved S segment. Sequencing analyses of recombinant clones of these substrates revealed that varying degrees of deletions and duplications exist at CSR breakpoints, suggesting the involvement of staggered cleavage of the S region in CSR. In addition, mutations frequently found near junctions showed a similar profile of base replacement to Ig somatic hypermutation. These findings suggest that single-strand tails of staggered cleavage may be repaired by error-prone DNA synthesis.
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