期刊名称：Proceedings of the National Academy of Sciences
印刷版ISSN：0027-8424
电子版ISSN：1091-6490
出版年度：1981
卷号：78
期号：9
页码：5293-5295
DOI：10.1073/pnas.78.9.5293
语种：English
出版社：The National Academy of Sciences of the United States of America
摘要：A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate--substrate normal interlayer distances. Applications are demonstrated, using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers can be determined with an accuracy of better than 3%.
关键词：adsorbate geometry ; Se—Ni system ; quasi-dynamical scattering theory
