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  • 标题:A reliability model for a wafer FAB
  • 本地全文:下载
  • 作者:Joong S. Jang ; Sang C. Park ; Chaoqun Wu
  • 期刊名称:Cogent Engineering
  • 电子版ISSN:2331-1916
  • 出版年度:2017
  • 卷号:4
  • 期号:1
  • 页码:1340817
  • DOI:10.1080/23311916.2017.1340817
  • 语种:English
  • 出版社:Taylor and Francis Ltd
  • 摘要:Abstract Proposed in this paper is a new reliability model for a wafer fabrication plant (FAB). The reliability prediction of a FAB is essential for various activities; feasibility evaluation, comparing competing designs, identifying potential reliability problems, planning maintenance and logistic support strategies, and input to other studies such as life-cycle cost analysis or order selection. The conventional reliability model, however, is not appropriate for a FAB because of inherent attributes of the manufacturing system; concurrent production of various products, reentrant material flows, and the recipe arrangement problem. To overcome this problem, this paper proposes a new reliability model of a FAB consisting of three reliability functions; reliability function of an entire FAB, reliability functions of tool groups, and reliability functions of FAB tools. To demonstrate the proposed reliability model, a simulation model is constructed based on a wafer FAB data-set. The simulation experiments are carried out with commercial software MOZART®.
  • 关键词:reliability model ; FAB ; failure rate ; reliability function ; simulation
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