首页    期刊浏览 2025年06月28日 星期六
登录注册

文章基本信息

  • 标题:Testing Effort Dependent Delayed S-shaped Software Reliability Growth Model with Imperfect Debugging
  • 本地全文:下载
  • 作者:M.U. Bokhari ; Md. Ashraf Siddiqui ; N. Ahmad
  • 期刊名称:International Journal on Computer Science and Engineering
  • 印刷版ISSN:2229-5631
  • 电子版ISSN:0975-3397
  • 出版年度:2017
  • 卷号:9
  • 期号:05
  • 页码:138-148
  • 出版社:Engg Journals Publications
  • 摘要:In software development process, testing is one of the most important aspects and hence, software reliably is very important factor of software systems. In the last four decades many software reliability growth model based on non-homogeneous Poisson process (NHPP) have been developed which incorporates testing effort function. However, the previous models are quite helpful for software engineers/ developers and commonly applicable in the industries and research institution. Still more testing-effort functions are required to incorporate into software reliability growth model. In this paper, we develop delayed S-shaped software reliability growth model with imperfect debugging which incorporates new modified Weibull testing�effort function (NMWTEF). We estimate the testing effort model parameters by least square and S-shaped software reliability growth parameters by maximum likelihood estimation techniques. We also present confidence interval of the software reliability growth parameters. Various software reliability measures are investigated through three numerical experiments. The numerical results are compared with other existing models in the literature. It is shown that the proposed Delayed S-shaped Software Reliability Growth Model with imperfect debugging with NMWTEF has a fairly better errors prediction capability..
  • 关键词:Software Testing; Software Reliability Growth; Testing Effort Functions; Least Square estimation; Maximum Likelihood estimation
国家哲学社会科学文献中心版权所有