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  • 标题:A Review on Different Approaches of Mutation Cost Reduction Techniques
  • 本地全文:下载
  • 作者:S. Sumithra ; T. Ramesh
  • 期刊名称:International Journal of Innovative Research in Computer and Communication Engineering
  • 印刷版ISSN:2320-9798
  • 电子版ISSN:2320-9801
  • 出版年度:2017
  • 卷号:5
  • 期号:1
  • 页码:771
  • DOI:10.15680/IJIRCCE.2017.0501164
  • 出版社:S&S Publications
  • 摘要:A mutation is a small change in a program. Such small changes are proposed to model low level defectsthat arise during the process of coding a software system. Mutation testing is a structural testing method designed forassessing and improving the accuracy of test suites and identifying the number of faults present in the software codeunder test. Mutation testing is carried out after the failure of traditional structure coverage analysis and manual peerreview has failed. The main drawback in mutation testing is that the cost of executing the mutants is high. Butresearchers have provided many cost reduction techniques to be applied during mutation testing. This paper provides acomprehensive view of all the cost reduction techniques developed and tested. This paper also presents the recenttrendy experimental results on mutation testing. The literature review part covers all the recent developments ofmutation testing.
  • 关键词:Mutation; clustering; mutant schemata; first order mutant; second order mutant; high order mutant
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