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  • 标题:Predicting Software Launch Readiness in a Complex Product
  • 本地全文:下载
  • 作者:Abhinav Sharma
  • 期刊名称:Computer Science & Information Technology
  • 电子版ISSN:2231-5403
  • 出版年度:2017
  • 卷号:7
  • 期号:11
  • 页码:127-138
  • DOI:10.5121/csit.2017.71110
  • 出版社:Academy & Industry Research Collaboration Center (AIRCC)
  • 摘要:A simple model used successfully for estimating and tracking software defects to predict launchreadiness of software in a complex product is described in this paper. The model is based ontracking the number of defects estimated to be found, actually found and resolved to measurethe quality of the product. Defect estimates can also help identify quality and process issues inthe development and testing phases.The defect estimation tracking method described here covers the whole project and is split intothe three phases Initial Defect Estimates (based on historical data), Interim Revised Estimates(based on actual performance of the project) and Final Defect Tracking (based on testing still todo). The method is based on existing development processes of the team so is easier toimplement and has been successfully applied in several projects.
  • 关键词:ware Reliability Growth Model; Defect Estimation; Software Quality Tracking; Schedule;Prediction
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