摘要：With the advent of new nanomanufacturing techniques has come the rise of the field of nanophotonics and an increased need to determine optical properties of novel structures. Commercial software packages are able to estimate the behavior, but require large resources and heavy computational time. By combining coordinate transforms and Effective Medium Theory (EMT), an effective relative permittivity tensor is defined and further exploited to calculate the polarization-coupled Fresnel coefficients through Maxwell’s equations. A uniaxial simplification is made to show the case of tilted nanorod arrays. To demonstrate the flexibility of this system, the interfacial reflectance has been calculated for both s - and p -polarizations as well as the coupled case with the volume filling fractions of f = 0.10 and 0.30 for silver (Ag) and titanium (Ti) nanorods, and a scenario of a Ag nanorod array with polymethyl methacrylate (PMMA) as the surrounding medium. The exact results computed by the finite-difference time-domain method justify the validity of EMT with polarization coupling taken into account. The effects of incidence angle and azimuthal angle on reflectance are also discussed. The relatively simple nature of this approach allows for fast estimations of the optical properties of various nanostructures.
