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文章基本信息

  • 标题:Can One Test Fit All? Responses to the Article “Striving for Simple but Effective Advice for Comparing the Central Tendency of Two Populations” (Ruxton & Neuhäuser, 2018)
  • 本地全文:下载
  • 作者:Nguyen, Diep ; Kim, Eun Sook ; Chen, Yi-Hsin
  • 期刊名称:Journal of Modern Applied Statistical Methods
  • 出版年度:2018
  • 卷号:17
  • 期号:2
  • 页码:9
  • 出版社:Wayne State University
  • 摘要:Responses to suggestions made by Ruxton & Neuhäuser (2018) regarding Nguyen et al. (2016) are given.
  • 关键词:Type I error controlstatistical power; parametric tests; independent means t-test; Satterthwaite’s approximate t-test; conditional t-test
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