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  • 标题:An electron backscattered diffraction analysis on microstructure of continuous unidirectional solidification Cu–2.5%Sn alloy
  • 本地全文:下载
  • 作者:Jihui Luo ; Jihui Luo ; Xiuting Liao
  • 期刊名称:IOP Conference Series: Earth and Environmental Science
  • 印刷版ISSN:1755-1307
  • 电子版ISSN:1755-1315
  • 出版年度:2019
  • 卷号:233
  • 期号:2
  • 页码:022010
  • DOI:10.1088/1755-1315/233/2/022010
  • 出版社:IOP Publishing
  • 摘要:A Cu–2.5%Sn alloy was fabricated by continuous unidirectional solidification (CUS). The EBSD was used to analyse the microstructure of CSU Cu–2.5%Sn alloy. The results show that the alloy is composed of coarse columnar grains, which grow along the direction of [001] and [101], and the average diameter of the columnar grains is about 470 μm. Most of grain boundaries between the columnar grains are small-angle and the rest are high-angle grain boundaries. It is also found that the CUS Cu–2.5%Sn alloy has strong {110} <110> texture and cubic texture.
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