摘要：Impedance imaging is an effective approach for non-intrusively reconstruct the distribution of dielectric parameters inside the region of interest. Most common form of impedance imaging is electrical impedance tomography (EIT), which requires direct contact with the medium via electrodes. In this work we present a novel impedance imaging using capacitive coupling which provides a contactless method, totally non-invasive and non-intrusive, by measuring the phase. There are less attentions in many prior works to the phase information of the voltage/current measurements. This work studies for the first time the capacitively coupled electrical phase spectroscopy for contactless dielectric parameter imaging. A 12-electrode capacitively coupled test phantom and a measurement system were used to obtain the phase measurements within a wideband frequency range from 200 kHz to 15 MHz. Background data with different conductivity levels were investigated in the experiments to show a broad application possibility. The forward modelling was implemented by simulation and the image reconstruction based on phase measurements was implemented with the total variation algorithm. The potentials, possibilities and challenges of such capacitively coupled dielectric spectroscopy tomography with phase data are discussed in this work.
