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  • 标题:Ion Sputter Induced Interfacial Reaction in Prototypical Metal-GaN System
  • 本地全文:下载
  • 作者:Rong Huang ; Fangsen Li ; Tong Liu
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2018
  • 卷号:8
  • 期号:1
  • 页码:8521
  • DOI:10.1038/s41598-018-26734-5
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:components were also detected due to the reaction between metal Ti and surface-adsorbed C species. Our study reveals that the corresponding core level binding energy and peak intensity obtained from ion sputter depth profile should be treated with much caution, since they will be changed due to ion-induced interface reactions and formation of by-products during ion bombardment.
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