摘要：POSS (polyhedral oligomeric silsesquioxane) provides an interesting alternative nano-silica and has the potential of superior dielectric properties to restrain electrical degradation. By incorporating POSS into EPDM to suppress electrical tree, one of precursors to dielectric failure, is promising to improve the lifetime of insulation materials. This paper focuses on the electrical treeing phenomena in EPDM/OVPOSS (ethylene propylene diene monomer/octavinyl-POSS) composites based on their physicochemical properties and trap distributions. ATR-IR and SEM characteristics are investigated to observe the chemical structure and physical dispersion of EPDM/OVPOSS composites. Electrical treeing characteristics are studied by the needle-plane electrode, and the trap level distributions are characterized by surface potential decay (SPD) tests. The results show that the 3 wt% EPDM/OVPOSS is more effective to restrain the electrical tree growth than the neat EPDM in this paper. It is indicated that the EPDM/OVPOSS with a filler content of 3 wt% introduces the largest energy level and trap density of deep trapped charges, which suppress the transportation of charge carriers injected from the needle tip and further prevent the degradation of polymer molecules. The polarity effects are obvious during the electrical treeing process, which is dependent on the trap level differences between positive and negative voltage.
