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  • 标题:Direct Auger recombination and density-dependent hole diffusion in InN
  • 本地全文:下载
  • 作者:Ramūnas Aleksiejūnas ; Žydrūnas Podlipskas ; Saulius Nargelas
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2018
  • 卷号:8
  • 期号:1
  • 页码:4621
  • DOI:10.1038/s41598-018-22832-6
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:/s at highest carrier densities. The resulting carrier diffusion length remains within 100-300 nm range, which is comparable to the light absorption depth. This feature is required for efficient carrier extraction in bipolar devices, thus suggesting MOCVD-grown InN as the material fit for photovoltaic and photonic applications.
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