Impact of Stylus Size in Roughness Measurement.
Kubatova, Dana ; Melichar, Martin ; Kutlwaser, Jan 等
Impact of Stylus Size in Roughness Measurement.
1. Introduction
Measurement and evaluation of surface texture have seen major
qualitative advances in recent years. Leading producers of measuring
instruments (Hommel, Carl Zeiss, and others) have responded actively to
new requirements. Surface texture is frequently checked by means of
single-purpose measuring instruments. For this reason, some of the key
players who put pressure on developing standards related to evaluating
the quality of measurement of machined surfaces are the manufacturers of
such instruments themselves. [2]
This has ultimately led to improved technologies of existing tools
for surface texture measurement and evaluation, as well as to better
methods, measuring systems and the system of assessment and evaluation
of surface texture that are still under development. [6; 7] The system
of assessment and evaluation of surface texture is defined by a body of
standards which describe designations, measurement, and evaluation of
surface texture, calibration of measuring instruments, and other
aspects. They are the GPS (Geometrical Product Specification) standards.
[5]
Generally, the measurement and assessment of surface texture
represents a separate field of metrology. Using special techniques, the
data required for characterizing the quality of surface can be obtained.
In order to assess the surface quality in an objective manner,
relevant information on the surface in question must be obtained by
measuring. First, the primary profile must be scanned using a stylus
tip. From this profile, individual sets of irregularities are then
filtered out (roughness, waviness, form of the surface) which comprise
the actual surface texture. These irregularities differ predominantly in
their spacing and their effects on the surface performance. This is why
they must be separated for analysis. [3;8] Components of the surface
texture are separated by filtering. In order to determine specific
roughness parameters (Ra, Rz and others) from the measured profile
(primary profile) of the surface, the roughness component must be
separated from other types of irregularities found in the surface.
However, when roughness is measured by a contact method, such as in this
case, data distortion (filtering) by the probe arm. Just the size of the
value distortion from the used tip was detected in the test described in
this article.
2. Measurement of surface roughness by contact method
The CSN EN ISO 3274:1998 standard defines a contact instrument as a
measuring instrument which explores surfaces with a stylus and acquires
deviations in the form of a surface profile, calculates parameters and
can record this profile. One of the important components of the
instrument is the measurement loop. It is a closed chain which comprises
all mechanical components that connect the work piece and the stylus
tip.
The accuracy of the measurement reading is influenced by the
following:
* stylus tip radius
* stylus tip apex angle
* measuring (loading) force
* rate of change of measuring force
In this article, we only focus on the effects of the stylus tip
radius. Hence, changes in surface roughness readings obtained with styli
of various sizes will be explored. The stylus tip should be pressed
against the surface with such a force that it remains in contact with
the surface under measurement during the transducer movement. According
to the CSN EN ISO 3274:1988 standard, the ideal stylus shape is a cone
with a spherical tip. The nominal radius of the tip is 2 [micro]m, 5
[micro]m, or 10 [micro]m; and the cone apex angle is 60[degrees], or
90[degrees].
3. Experimental
Testing was carried out in the Hommel Etamic T8000 machine. Styli
of 2 and 5 [micro]m with the apex angle of 90[degrees] were fitted to
the machine. The tests also included investigation of the impact of
using an old (worn) stylus; with both stylus tip sizes. Fig. 3-6 show
electron micrographs of the actual stylus tip shapes.
The test pieces were roughness standards. Their roughness values
were verified through calibration by an independent contractor. [12]
These roughness values were chosen so that the experiment takes place
within the Rsm parameter (periodic surface) interval in which the use of
both sizes of stylus tips is permitted, as indicated in Tab. 1.
Prior to measurement, each reference standard was divided into
fields of 10*6 mm size (Fig. 6). Measurement was then carried out in
each of these fields. The paths were arranged not to overlap which was
made possible by the machine's precision measuring table. After the
standard had been installed in the required position, its movement was
effected exclusively by the measuring table. All measurement runs were
repeated twice. The pattern of measuring paths started 0.5 mm from the
field's boundary. Each subsequent path was spaced 1 mm from the
previous one (0.5; 1.5; 2.5; ...).
In this test, a wide range of roughness parameters relating to all
fields were evaluated, including all kinds of profile parameters,
roughness parameters and waviness parameters. This article only
describes those which are most often used in the automotive industry and
aircraft engineering. Their values were calculated using the robust
Gaussian filter which leads to the most faithful representation of the
acquired profile. More information on filters can be found in articles
13 and 11.
4. Processing of results
The test machine was set up according to information obtained from
preliminary tests conducted on individual standards. The set-up
parameters were in agreement with the area indicated in red in Table 1.
A detailed list is given in Table 2.
Results were evaluated in several steps:
* In the first step, the parameter values were averaged across the
entire standard and for the particular stylus tip. These values are
plotted in graphs here.
* In the second step, the percent difference between values of
selected parameters were calculated. These were values measured with
stylus tips of the same size but different wear levels. The values
measured with the new stylus tip were taken as the reference values.
* In the third step, the percent difference between stylus tips
with the same wear level but different tip radii was calculated. The
reference value was the value measured with the stylus tip of 2 [micro]m
size.
4.1 Ra 0.5 standard
The roughness value Ra 0.5 [micro]m of this standard is the lowest
roughness value used in this test. The surface of the standard is
strictly periodic. Prior to measurement, the machine is set up on the
basis of the roughness parameter Rsm ("Mean value of the profile
element widths within a sampling length." [4]). During preliminary
testing, the value Rsm = 0.1301 [micro]m was very close to the lower
limit of the marked area in Table 1. Nevertheless, it still met the
condition of staying within the interval in which either of the 2
[micro]m and 5 [micro]m styli can be used.
4.1.1 Profile parameters
Since profile parameter results are not distorted by filters, they
are good for exploring the effects of mechanical characteristics in the
roughness measurement process. The following parameters were chosen:
* Pt--"Sum of the height of the largest profile peak height
and the largest profile valley depth within the sampling length."
[4]
* Pa--"Arithmetic mean of absolute ordinate values within a
sampling length." [4]
4.1.2 Roughness parameters
Unlike profile parameters, roughness parameters are subject to
distortion by the filter used for their calculation. For this reason,
greater emphasis was placed on profile parameters during the processing
of results. Despite that, the article reports the effects on two most
common roughness parameters.
* Ra--"Arithmetic mean of absolute ordinate values within a
sampling length." [4]
* Rz--"Sum of the height of the largest profile peak height
and the largest profile valley depth within a sampling length." [4]
4.1.3 Interim summary
The differences between values of surface roughness parameters
(i.e. R parameters) measured by 2 [micro]m and 5 [micro]m styli are
neither large nor significant. With all the parameters, including those
not listed here, the percent differences were under 1%. It is not so
when one evaluates surface profile parameters (i.e. P parameters). Here,
the differences become more notable. Ordinarily, they reach 5% but there
are exceptions, such as with the Pa parameter in this article.
The differences between values measured by styli of different sizes
are less than the differences between values from old and new styli.
Although manufacturers of the equipment claim the stylus tips do not
wear, some differences were expected even before starting this
experiment. However, the differences found were larger than expected.
With profile parameters, they reach as much as 20%. With roughness
parameters, they are lower. Yet, the resulting difference of around 5%
is appreciable, given the importance of each micrometre.
4.2 Ra 1 standard
The roughness of this standard represents a value which is
ordinarily prescribed and used in practice. This standard, too, has an
exclusively periodic surface. The value of the Rsm parameter which
governed this test was in the middle of the interval required for this
test. The value was Rsm = 0.254 [micro]m, which was ideal for this test.
4.2.1 Profile parameters
* Pt--"Sum of the height of the largest profile peak height
and the largest profile valley depth within the sampling length."
[12]
* Pa--"Arithmetic mean of absolute ordinate values within a
sampling length." [12]
4.2.2 Roughness parameters
The following parameters were chosen:
* Ra--"Arithmetic mean of absolute ordinate values within a
sampling length." [12]
* Rz--"Sum of the height of the largest profile peak height
and the largest profile valley depth within a sampling length."
[12]
4.2.3 Interim summary
The values collected with stylus tips of different sizes were
compared. The differences in surface roughness readings (R parameters)
from stylus tips of 2 and 5 [micro]m size were negligible. With all the
parameters, including those not listed here, the percent differences
were under 1%. The differences in profile parameters (i.e. P parameters)
are smaller for the Ra 1 [micro]m standard than for the Ra 0.5 [micro]m
one. Here, the typical difference is 2-3%.
In this case, the difference between the old and new stylus tips
disappears, somewhat unexpectedly after the findings from the standard
with a lower value. The differences found here are several tenths of
percent which represents rather negligible distortion of measurement
readings.
4.3 Ra 3.2 standard
This standard had the highest roughness value in this test. Its
surface was periodic, as in the previous cases. Its Rsm value was
outside the desired interval by a small margin. Nevertheless, the
findings were used for showing how the need for correct stylus tip
identification rises with increasing roughness value. The parameter
value was Rsm = 0.408 [micro]m.
4.3.1 Profile parameters
* Pt--"Sum of the height of the largest profile peak height
and the largest profile valley depth within the sampling length."
[12]
* Pa--"Arithmetic mean of absolute ordinate values within a
sampling length." [12]
4.3.2 Roughness parameters
The following parameters were chosen:
* Ra--"Arithmetic mean of absolute ordinate values within a
sampling length." [12]
* Rz--"Sum of the height of the largest profile peak height
and the largest profile valley depth within a sampling length." [4]
4.3.3 Interim summary
The graphs clearly show that values obtained with both styli are
nearly identical. This holds for both roughness parameters (R
parameters) and profile parameters (P parameters). With all the
parameters, the percent differences were under 1%.
However, those between old and new styli were rising sharply. In
this test, they even exceeded 30%. This is a value which is unthinkable
in precision measurement.
5. Conclusion
Today's demands on high-speed components are increasing,
giving rise to a need for measuring geometric parameters and deviations
and even surface integrity parameters in such components. This is one of
the reasons why measurement and evaluation of surface texture have seen
major qualitative advances in recent years. Leading producers of
measuring instruments (Hommel, Carl Zeiss, and others) have responded
actively to new requirements. They did so despite the fact that surface
texture is frequently measured and evaluated by means of single-purpose
measuring machines--and developed new machines, equipment, methods,
standards and guidelines.
The purpose of this article was to map at least a small part of
this field. It describes an analysis of the effects that the size and
shape of a stylus tip has on the readings that characterize surface
texture elements. The results of this research will be further used and
implemented in the design of methods for the selection of software
filters for roughness measurement.
The tests were carried out using the Hommel Etamic T8000 machine
housed at the Regional Technological Institute affiliated with the
University of West Bohemia. Styli with two tip radii (2 and 5 [micro]m)
with an apex angle of 90[degrees] were employed. The styli tested were
part of new and used probe arms. Test pieces were roughness standards of
nominal values of Ra = 0.5; 1; 3.2 [micro]m. Surface texture parameters
were calculated with a robust Gaussian filter. Each standard was divided
into 12 fields of 10*6 mm size. Four primary profiles were measured in
each field. These measurement runs were repeated twice. This test is
planned to be repeated in the future on higher and lower-roughness
surfaces.
The data were evaluated in several steps. In the first step, the
parameter values were averaged across the entire standard and for the
particular stylus tip. These values are plotted in graphs here. In the
second step, the percent differences between values of selected
parameters were calculated. These were values measured with stylus tips
of the same size but different wear levels. The values measured with the
new stylus tip were taken as the reference values. In the third step,
the percent difference between stylus tips with the same wear level but
different tip radii was calculated. The reference value was the value
measured with the stylus tip of 2 [micro]m size.
Results that characterize the effect of the stylus tip radius can
be divided into two groups. The first group comprises the profile
parameters (P parameters). Their calculation is not affected by any
filter. They are an effective indicator of the impact of the stylus tip
radius. With all three standards, the differences between these
parameters were under 3%. The second group consists of roughness
parameters (R parameters). These are demanded by customers much more
often than those of the former group. To calculate them, one has to use
mathematical formulae to separate (filter) them from the primary
profile. It is a source of a certain percent error. It also distorts any
errors introduced by an inadequate choice of a stylus tip radius. Here,
the percent difference was under 1%. This is a very favourable finding
but caution should be exercised, considering the filter used. With the
2RC filter, these values in the second group reach 5-8%.
Nevertheless, these values, too, are negligible when compared to
the differences between data from used and new styli. Some difference
was expected there, despite manufacturers' claims that styli do not
suffer any wear. However, most of the differences found were larger than
expected. With profile parameters, they reached as much as 20%. With
roughness parameters, the value was less extreme. Still, the final
difference of about 5% is appreciable in the field where every
micrometre matters.
DOI: 10.2507/28th.daaam.proceedings.064
6. Acknowledgments
The article has been prepared in the project LO1502
'Development of the Regional Technological Institute' under
the auspices of the National Sustainability Programme I of the Ministry
of Education of the Czech Republic aimed to support research,
experimental development and innovation.
7. References
[1] ISO/TS 16610-1 Technical specification ISO/TS 16610.
Geometrical product specifications (GPS)--Filtration, 2015.
[2] CSN EN ISO 16610-20. Geometrical product specifications
(GPS)--Filtration--Part 20: Linear profile filters: Basic concepts.
Brussels: UNMZ, 2015.
[3] CSN ISO/TS 16610-21 Geometrical product specifications
(GPS)--Filtration--Part 21: Linear profile filters: Gauss filters.
Brussels: UNMZ, May 2012
[4] CSN EN ISO 16610-40. Geometrical product specification
(GPS)--Filtration--Part 40: Morphological profile filter: Basic
concepts, 2016
[5] CSN EN ISO 4287. Geometrical product specification
(GPS)--Surface structure: Profile method--Terms, definitions and surface
texture parameters--Part 1; Brussels: CEN, 1999.
[6] http://www.hommel-etamic.cz/cz/technicke-informace/drsnost-povrchu-dle-din-en-iso/ [online]. [2016-08-27]
[7] http://www.techno-mat.cz/data/katedry/kom/KOM_MM_PR_10_czE_Karasek _Geometricke_vlastnosti_povrchu.pdf [online]. [cit. 2015-02-01].
[8] https://www.olympus-ims.com/en/knowledge/metrology/roughness/[online]. [cit. 2015-09-01].
[9] https://www.hommel-etamic.cz/files/2009-13_en_roughness_poster.pdf[online]. [cit. 2015-09-01].
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Caption: Fig. 1. Stylus [9]
Caption: Fig. 2. Old tip 2
Caption: Fig. 3. New tip 2
Caption: Fig. 4. Old Tip 5
Caption: Fig. 5. New tip 5
Caption: Fig. 2. Segmentation of the standard
Caption: Graph 1. Graphic evaluation of Pt parameter
Caption: Graph 2. Graphic evaluation of Pa parameter
Caption: Graph 3. Graphic evaluation of Ra parameter
Caption: Graph 4. Graphic evaluation of Rz parameter
Caption: Graph 5. Graphic evaluation of Pt parameter
Caption: Graph 6. Graphic evaluation of Pa parameter
Caption: Graph 7. Graphic evaluation of Ra parameter
Caption: Graph 8. Graphic evaluation of Rz parameter
Caption: Graph 9. Graphic evaluation of Pt parameter
Caption: Graph 10. Graphic evaluation of Pa parameter
Caption: Graph 11. Graphic evaluation of Ra parameter
Caption: Graph 12. Graphic evaluation of Rz parameter
Table 1. Table of values for roughness measurement [10]
Periodic profiles
e.g. turning, miling
RSm (mm)
>0.013 ...0.04
>0 04 ...0.13
>0.13 ...0.4
>0.4 ...1.3
>1.3 ...4
Measuring conditions
lr sampling length
ln evaluation length
lt traverse length
[lambda]c cut-off
[lambda]s shortwave profile filter
[r.sub.tip] stylus tip radius
[DELTA]X digitization distance (1)
(1) The digitisation distance
s also standardized. This is
set automaticaly by most
roughness measuring instruments
[lambda]c [r.sub.tip] [lambda]s
= lr (mm) ln (mm) lt (mm) (Mm) ([micro]m)
0.08 0.4 0.48 2 2.5
0.25 1.25 1.5 2 2.5
0.8 4 4.8 2 or 5 * 2.5
2.5 12.5 15 5 8
8 40 48 10 25
Aperiodic profiles
e.g. grinding, eroding
Ra ([micro]m) Rz ([micro]m)
>(0.006) ...0.02 >(0.025) ...0.1
>0.02 ...0.1 >0.1 ...0.5
>0.1 ...2 >0.5 ...10
>2 ...10 > 10 ...50
>10 ...80 >50 ...200
Table 2. Surface roughness tester set-up parameters
Rsm [nm] Lt [mm] Lc [mm] [r.sub.tip] [mm]
Ra 0.5 [micro]m/Rz 0.1301 4.8 0.8 2 or 5
Ra 1 [micro]m/Rz 0.254 4.8 0.8 2 or 5
Ra 3.2 [micro]m/Rz 0.408 4.8 0.8 2 or 5
Table 3. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 21.9752347 18.43596647
Table 4. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -3.916264416 -4.973875115
Table 5. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 17.846048905 17.242688875
Table 6. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % 0.046245448 -0.608182275
Table 7. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 5.262520458 4.940866367
Table 8. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -0.122749591 -0.345259897
Table 9. Percent difference between the new and the old stylus tip
2 [micro]m 5[micro]m
difference in % 5.338913264 5.658038097
Table 10. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -2.564967938 -1.19364718
Table 1. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 2.429639298 3.273100033
Table 2. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -2.71021078 -2.64078042
Table 3. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 0.82355674 2.22645922
Table 4. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -1.89526753 -1.80516959
Table 5. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 1.414392181 0.42639593
Table 6. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -0.285074323 -1.290102123
Table 7. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 0.084792627 -0.082396563
Table 8. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % 0.886659278 0.72081186
Table 9. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 32.931900778 31.908741288
Table 10. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % 0.666839942 -0.380194729
Table 11. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 31.90680923 31.18939696
Table 12. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % 0.161789533 -0.651271682
Table 13. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 31.057187017 30.643301276
Table 14. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % 0.225399279 -0.191965897
Table 15. Percent difference between the new and the old stylus tip
2 [micro]m 5 [micro]m
difference in % 7.275296338 3.140746414
Table 16. Percent difference between the 2 [micro]m and 5 [micro]m
stylus tips
New Old
difference in % -0.094356313 -7.795952047
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