摘要：The testing phase is becoming the most crucial part of the overall design process, which delays the timeto- market of the digital devices. In order to reduce the complexity of test generation and to decrease the time-tomarket, one needs to begin the test design at higher levels of abstraction. In this paper a new approach for functional delay test enrichment is described. The test enrichment procedure does not increase the test size and is fast because it does not require test generation. The described approach enriches the test patterns using fault simulation. The performed experiments demonstrate effectiveness of the proposed approach.
