摘要：The analysis how the functional fault tests detect structural faults at gate-level shows that the stuck-at fault coverage is much higher than transition fault coverage. The aim of the paper is to discover the reasons of this phenomenon and to propose the techniques of functional delay test quality improvement. We suggest, by transforma-tion of pin pair test into functional delay test, to use variable number of fault detections. The performed experiments show the effectiveness of the introduced approach.
