摘要：Compact test sets are very important for degrading the cost of testing the very large-scale integrated circuits by reducing the test application time. Small test sets also lessen the test storage requirements. The only way to compact functional delay fault tests is to enable multi-input transitions in test pattern pairs. The goal of the paper is to analyze the impact of multi-input transitions in test pattern pairs on the transition fault coverage. The performed research shows that the quality of functional delay fault MIT tests in regard of detection of structural level transition faults is higher than that of functional delay fault SIT tests. However, the application of MIT tests instead of SIT tests for transition fault detection may as well decrease the transition fault coverage. The reasons are in changed conditions of signal propagation from circuit input to circuit output. The possible ways to increase the quality of MIT tests are proposed in this work as well.
