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文章基本信息

  • 标题:Beating Brute Force for Polynomial Identity Testing of General Depth-3 Circuits
  • 本地全文:下载
  • 作者:Vikraman Arvind ; Abhranil Chatterjee ; Rajit Datta
  • 期刊名称:Electronic Colloquium on Computational Complexity
  • 印刷版ISSN:1433-8092
  • 出版年度:2018
  • 卷号:2018
  • 出版社:Universität Trier, Lehrstuhl für Theoretische Computer-Forschung
  • 摘要:

    Let C be a depth-3 arithmetic circuit of size s , computing a polynomial f F [ x 1 x n ] (where F = Q or C ) with fan-in of product gates bounded by d . We give a deterministic time 2 d poly ( n s ) polynomial identity testing algorithm to check whether f 0 or not.

    In the case of finite fields, for d"> Char ( F ) d we obtain a deterministic algorithm of running time 2 d poly ( n s ) , whereas for Char ( F ) d , we obtain a deterministic algorithm of running time 2 ( +2) d log d poly ( n s ) where 5 .

  • 关键词:Depth 3 arithmetic circuits ; polynomial identity testing
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