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  • 标题:Enhanced noise at high bias in atomic-scale Au break junctions
  • 本地全文:下载
  • 作者:Ruoyu Chen ; Patrick J. Wheeler ; M. Di Ventra
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2015
  • 卷号:4
  • 期号:1
  • DOI:10.1038/srep04221
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:Heating in nanoscale systems driven out of equilibrium is of fundamental importance, has ramifications for technological applications, and is a challenge to characterize experimentally. Prior experiments using nanoscale junctions have largely focused on heating of ionic degrees of freedom, while heating of the electrons has been mostly neglected. We report measurements in atomic-scale Au break junctions, in which the bias-driven component of the current noise is used as a probe of the electronic distribution. At low biases (
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