摘要：In situ characterization of the work function of quasi one dimensional nanomaterials is essential for exploring their applications. Here we proposed to use the electrostatic deflection induced by work function difference between nanoprobe and nanowire for in situ measuring the local work function along a free standing nanowire. The physical mechanism for the measurement was discussed in details and a parabolic relationship between the deflection and the potential difference was derived. As a demonstration, measurement of the local work functions on the tip and the sidewall of a ZnO nanowire with Au catalyst at its end and a LaB6 nanowire have been achieved with good accuracy.
