首页    期刊浏览 2024年10月06日 星期日
登录注册

文章基本信息

  • 标题:Carrier-induced transient defect mechanism for non-radiative recombination in InGaN light-emitting devices
  • 本地全文:下载
  • 作者:Junhyeok Bang ; Y. Y. Sun ; Jung-Hoon Song
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2016
  • 卷号:6
  • 期号:1
  • DOI:10.1038/srep24404
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:Non-radiative recombination (NRR) of excited carriers poses a serious challenge to optoelectronic device efficiency. Understanding the mechanism is thus crucial to defect physics and technological applications. Here, by using first-principles calculations, we propose a new NRR mechanism, where excited carriers recombine via a Frenkel-pair (FP) defect formation. While in the ground state the FP is high in energy and is unlikely to form, in the electronic excited states its formation is enabled by a strong electron-phonon coupling of the excited carriers. This NRR mechanism is expected to be general for wide-gap semiconductors, rather than being limited to InGaN-based light emitting devices.
国家哲学社会科学文献中心版权所有