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  • 标题:Characterization of the 3D structure of a cultivated land surface and its influence on wheat seedlings growth using Kinect
  • 本地全文:下载
  • 作者:Tao Liu ; Wen Chen ; Fujian Li
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2017
  • 卷号:7
  • 期号:1
  • DOI:10.1038/s41598-017-04392-3
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:The quality of wheat emergence has a significant impact on the subsequent growth and development of seedlings. The structure of cultivated land surfaces is an important factor influencing wheat seedlings growth. However, few studies have investigated this. In this study, three-dimensional structural parameters of cultivated land surfaces were collected using 3D imaging equipment, and the effects of different grades of lands on the emergence and growth of wheat were evaluated. The evaluation criteria for the soil blocks was designed according to the ISO-25178-2 standard, and the wheat emergence rate, speed, tillering capacity per plant, dry weight per plant, and final yields of different grades of cultivated land were investigated. The results indicated that the three-dimensional information obtained through the Kinect sensors was reliable. The deviation of measured values from the factual values was trivial. The value of R(2) was greater than 0.99(**). The value of RMSE was less than 2 mm. These results describe a method for obtaining three-dimensional structures of land surfaces using 3D cameras and the evaluation of wheat emergence capacity. It can be used as a reference for obtaining three-dimensional cultivated land structures or other similar objects.
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