摘要：The working threshold is an important parameter to assess the performance of cavity-free random lasers. Here, the temporal profile measurement is proposed as an alternative method to determine the thresholds of the surface plasmon based random lasers pumped by ns pulses based on analyzing the delay time (t Delay) and rising time (t R) of the emission signal. The obvious and slight inflection points of the curves of t Delay and t R varying with the pump power density are observed as indicators for the thresholds of random lasing and for the transition of lasing mode, respectively. The proposed method supplies consistent values to those supplied by traditional methods in frequency-domain for the random systems with different gain length. The demonstrated temporal profile approaches are free from the spectrometers and may be as a candidate for measuring the threshold of random lasers in ultrafast optics, nonlinear optics and bio-compatible optoelectronic probes.
