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  • 标题:Habituation/Fatigue behavior of a synapse memristor based on IGZO–HfO2 thin film
  • 本地全文:下载
  • 作者:Ran Jiang ; Pengfei Ma ; Zuyin Han
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2017
  • 卷号:7
  • 期号:1
  • DOI:10.1038/s41598-017-09762-5
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:A synaptic memristor based on IGZO and oxygen-deficient HfO2 films has been demonstrated. The memristor exhibits a fatigue response to a monotonic stimulus of voltage pulses, which is analogous to the habituation behavior of biological memory. The occurrence of habituation is nearly simultaneous with the transition from short-term memory to long-term memory. The movement and redistribution of oxygen species with the assistance of polarization in HfO2 layer are responsible for the above results. The observation of habituation behavior proves the potential prospect of memristor on the mimic of biological neuron.
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