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  • 标题:Exit point in the strong field ionization process
  • 本地全文:下载
  • 作者:I. A. Ivanov ; Chang Hee Nam ; Kyung Taec Kim
  • 期刊名称:Scientific Reports
  • 电子版ISSN:2045-2322
  • 出版年度:2017
  • 卷号:7
  • 期号:1
  • DOI:10.1038/srep39919
  • 语种:English
  • 出版社:Springer Nature
  • 摘要:We analyze the process of strong field ionization using the Bohmian approach. This allows retention of the concept of electron trajectories. We consider the tunnelling regime of ionization. We show that, in this regime, the coordinate distribution for the ionized electron has peaks near the points in space that can be interpreted as exit points. The interval of time during which ionization occurs is marked by a quick broadening of the coordinate distribution. The concept of the exit point in the tunneling regime, which has long been assumed for the description of strong field ionization, is justified by our analysis.
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