摘要：The century-old controversy over two contradicting theories on radiation pressure of light proposed by Abraham and Minkowski can come to an end if there is a direct method to measure the surface deformation of the target material due to momentum transfer of photons. Here we have investigated the effect of radiation pressure on the surface morphology of Graphene Oxide (GO) film, experienced due to low power focused laser irradiation. In-depth investigation has been carried out to probe the bending of the GO surface due to radiation pressure by Atomic Force Microscopy (AFM) and subsequently the uniaxial strain induced on the GO film has been probed by Raman Spectroscopy. Our results show GO film experience an inward pressure due to laser radiation resulting in inward bending of the surface, which is consistent with the Abraham theory. The bending diameter and depth of the irradiated spot show linear dependence with the laser power while an abrupt change in depth and diameter of the irradiated spot is observed at the breaking point. Such abrupt change in depth is attributed to the thinning of the GO film by laser irradiation.
