摘要：In recent years, deep sub-micron technology has promoted the booming of the semiconductor industry, but it also makes it difficult to test the chips. The integration of chips is becoming much more complicated, and traditional online test methods are incapable of testing high-reliability systems efficiently. Against this background, we propose a novel test structure based on Software Based Self-Test (SBST) to assist in testing aviation system. This structure employs a low-overhead microprocessor to control the entire test flow, including testing of the processor itself and testing of the target circuits. In order to achieve ideal test effect, we focus on applying optimal test methods to different parts of the circuit such as DFT and ATPG. The on-line test results of a LVDT module for avionics control system proves that the test structure is efficient and flexible.
