期刊名称：Lecture Notes in Engineering and Computer Science
印刷版ISSN：2078-0958
电子版ISSN：2078-0966
出版年度：2018
卷号：2235&2236
页码：241-246
出版社：Newswood and International Association of Engineers
摘要：Since the complexity of electrical system has been
aggravated as the deep-submicron technology in chip
manufacturing continuously develops, chips are far more likely
to be affected by various faults. Effective on-line testing method
is a great challenge for high reliability system design. We
propose a novel test structure based on Software Based
Self-Test (SBST) to implement on-line test with low overhead.
This test structure adopts a microprocessor to apply test
stimulus, analyze test response and manage the test process.
The microprocessor should define the specific test instructions
and primarily accomplish the self-test for verification its own
function. Test vectors of some modules are generated by
TetraMAX for achieving high fault coverage and reducing area
overhead. The on-line test results of a LVDT module for
avionics control system show the efficiency and flexibility of
proposed test scheme.
