期刊名称：International Journal of Applied Exercise Physiology
电子版ISSN：2322-3537
出版年度：2019
卷号：8
期号：2
页码：559-574
语种：English
出版社：Asian Exercise and Sport Science Association
摘要：The work is concerned with development and application of behavioral models as parts of automated measurement systems to test integrated circuits (IC) of high-frequency voltage switching converters with the aim to automate measurement process, search and use methods for controlling junction-case thermal resistance in the most rational way. A description is provided of an alternate implementation of test equipment and an algorithm for determining thermal resistance, which applies a reference behavioral model in the process of automated testing of integrated circuits. Modelling of integrated circuit LM2596 is made, taking into account heat emission and mutual effect of crystal temperature on external electrical characteristics inherent in the general behavioral model. The results were obtained, coincident with experimental data and transistor level SPICE-model, and dependencies reflecting the effect of crystal temperature on microcircuit operation were found. A method for automated control of controlling junction case thermal resistance is suggested. It is customized in terms of speed of performing measurements and is suitable for use in microelectronic industry. Its limitations and application area have been defined. Potential use of behavioral models as a source of reference data during testing electronic components is presented.
关键词：automated test equipment; controlling parameters ofmicrocircuits; voltage switching converters; behavioral model; VHDL-AMS; thermal resistance
