摘要：Today, semiconductor elements are becoming more popular in power supply networks. Their presence in any objects of electrical equipment provides high performance with high operating efficiency. However, modern research shows the semiconductor element base negatively affects quality of electricity when they are used in parallel. In low- and medium-voltage networks, this is fraught with the appearance of frequency «noise», which negatively affects parameters equipment with presence of latter, as well their control system. To detect them, a special approach is necessary, since such harmonics can appear both from directly semiconductor elements and from operating mode of equipment where element base is applied. The purpose of this article identifies higher harmonic distortions generated by objects containing semiconductor elements.
其他摘要：Today, semiconductor elements are becoming more popular in power supply networks. Their presence in any objects of electrical equipment provides high performance with high operating efficiency. However, modern research shows the semiconductor element base negatively affects quality of electricity when they are used in parallel. In lowand medium-voltage networks, this is fraught with the appearance of frequency «noise», which negatively affects parameters equipment with presence of latter, as well their control system. To detect them, a special approach is necessary, since such harmonics can appear both from directly semiconductor elements and from operating mode of equipment where element base is applied. The purpose of this article identifies higher harmonic distortions generated by objects containing semiconductor elements.
