摘要：The specific surface area (SSA) is considered an essential microstructural parameter for the characterization of snow. Photography in the near-infrared (NIR) spectrum is sensitive to the SSA. We calculated the snow reflectance from calibrated NIR images of snow-pit walls and measured the SSA of samples obtained at the same locations. This new method is used to map the snow stratigraphy. The correlation between reflectance and SSA was found to be 90%. Calibrated NIR photography allows quantitative determination of SSA and its spatial variation in a snow profile in two dimensions within an uncertainty of 15%. In an image covering 0.5–1.0 m 2 , even layers of 1mm thickness can be documented and measured. Spatial maps of SSA are an important tool in initializing and validating physical and chemical models of the snowpack.
