摘要：Optical phase-gradient metasurfaces, whose unique capabilities are based on the possibility to arbitrarily control the phase of reflected/transmitted light at the subwavelength scale, are seldom characterized with direct measurements of phase gradients. Using numerical simulations and experimental measurements, we exploit the technique of scanning differential heterodyne microscopy (SDHM) for direct phase and amplitude characterization of gap-plasmon based optical metasurfaces. Two metasurface configurations utilizing the third-order gap surface plasmon (GSP) resonance, representing a binary grating and linear phase gradient, are experimentally characterized with the SDHM operating at the light wavelength of 633 nm. Comparing the experimental performances of these GSP metasurfaces with those expected from the phase and amplitude profiles reconstructed from the SDHM measurements, we verify the efficiency and accuracy of the developed SDHM characterization approach for direct inspection of GSP reflective metasurfaces.
