摘要：Discussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristics may differ in value of the other characteristic. The combination of test methods can significantly reduce the potential of not detecting the failure of digital device. The technique is aimed at increasing the information content of the healthy state monitoring results and the possibility of localizing failures in digital instruments and devices of power systems.
