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  • 标题:The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
  • 本地全文:下载
  • 作者:J. Maxa ; V. Neděla
  • 期刊名称:Advances in Military Technology
  • 印刷版ISSN:1802-2308
  • 电子版ISSN:2533-4123
  • 出版年度:2011
  • 卷号:6
  • 期号:1
  • 语种:English
  • 出版社:University of Defence
  • 摘要:Environmental scanning electron microscope creates new possibilities in the field of examination of various types of specimens and their phases. The article analyses and compares the results of air pumping measurement for selected shapes of the differentially pumped chamber to create vacuum,using the Cosmos FloWorks system.
  • 关键词:EREM;CAE;SolidWorks;Cosmos;FEI;Differentially Pumped Chamber
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